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Omron develops new CT-type X-ray inspection device for EVs and autonomous driving applications

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The VT-X750-V3 delivers an inspection speed 1.5 times faster than the present models

Omron has developed a new CT-type X-ray inspection device for 3D inspection of electronic substrates in electric vehicles (EVs), and autonomous driving application products, it said in a press release on 10 November.

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